Research Article

Vision Machine Learning for Efficient Defect Triaging in Repair Operations

Authors

  • Prasad Rao University of Mumbai, India

Abstract

The manufacturing industry along with electronics sectors experience a new technological revolution through Vision Machine Learning for their repair operations defect triaging procedures. The inspected quality control system based on ML enables fundamental change from human-operated methods by using deep learning constructs such as CNNs to perform automatic defect recognition and classification along with priority management tasks. Today's move toward automated visual analysis solves three major problems: human inspector fatigue as well as variable human-based evaluation and restricted inspection speed. Advanced ML systems integrate multiple sensor types through transfer learning techniques to obtain both reduced training data needs and better detection precision and steadiness. The implementation structures of production systems include edge computing, cloud infrastructure and combination models which provide varying benefits throughout production settings. Research-based defect management workflows enhance optimized queue management and enable structured maintenance information storage and economic decision capability which shortens cycles and enhances repair quality. The deployment of these technologies in existing repair systems delivers operational effectiveness and quality upshots through supportive evaluation frameworks and continuous improvement procedures.

Article information

Journal

Journal of Computer Science and Technology Studies

Volume (Issue)

7 (4)

Pages

42-53

Published

2025-05-09

How to Cite

Prasad Rao. (2025). Vision Machine Learning for Efficient Defect Triaging in Repair Operations. Journal of Computer Science and Technology Studies, 7(4), 42-53. https://doi.org/10.32996/jcsts.2025.7.4.5

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Keywords:

Visual Defect Detection, Machine Learning Inspection, Repair Operations Optimization, Deep Learning Classification, Automated Quality Control